| 摘要 |
To test wiring provided on a tested substrate, a test jig is used for electrically connecting a testing device for testing the tested substrate to a test point provided on the tested substrate. The test jig has: a flexible and conductive contactor, one end of which conductively contacts the test point and the other end of which conductively contacts an electrode portion electrically connected to the testing device; a test-side support body having a test guide hole for guiding the one end of the contactor to the test point; and an electrode-side support body having an electrode guide hole for guiding the other end of the contactor to the electrode portion. The contactor has a first end contacting the test point, a second end contacting the electrode portion, a rod-like conductive conductor portion having flexibility, and an insulating portion formed by coating an insulator on the outer circumference of the conductor portion excluding the first and second ends. The length of the second end portion is formed shorter than the depth of the electrode guide hole touching an electrode body. The test jig facilitates the alignment between the rear-end of the contactor and an electrode and enables accurate testing. |
