发明名称 Method and apparatus for plasma dicing a semi-conductor wafer
摘要 The present invention provides a method for plasma processing a substrate. The method comprising providing a process chamber having a wall; providing a plasma source adjacent to the wall of the process chamber; providing a work piece support within the process chamber; loading a work piece onto the work piece support, the work piece having a support film, a frame and the substrate; providing a cover ring above the work piece, the cover ring having at least one perforated region, and at least one non-perforated region; generating a plasma using the plasma source; and processing the work piece using the generated plasma.
申请公布号 US8691702(B2) 申请公布日期 2014.04.08
申请号 US201313829324 申请日期 2013.03.14
申请人 PLASMA-THERM LLC 发明人 GEERPURAM DWARAKANATH;PAYS-VOLARD DAVID;MARTINEZ LINNELL;JOHNSON CHRIS;JOHNSON DAVID;WESTERMAN RUSSELL
分类号 H01L21/302;H01L21/00;H01L21/461 主分类号 H01L21/302
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