发明名称 CHECKING THE STOICHIOMETRY OF I-III-VI LAYERS FOR USE IN PHOTOVOLTAICS USING IMPROVED ELECTROLYSIS CONDITIONS
摘要 The invention relates to manufacturing a I-III-VI compound in the form of a thin film for use in photovoltaics, including the steps of: a) electrodepositing a thin-film structure, consisting of I and/or III elements, onto the surface of an electrode that forms a substrate (SUB); and b) incorporating at least one VI element into the structure so as to obtain the I-III-VI compound. According to the invention, the electrodeposition step comprises checking that the uniformity of the thickness of the thin film varies by no more than 3% over the entire surface of the substrate receiving the deposition.
申请公布号 KR20140041384(A) 申请公布日期 2014.04.04
申请号 KR20137012205 申请日期 2011.10.10
申请人 NEXCIS 发明人 GRAND PIERRE PHILIPPE;JAIME SALVADOR;DE GASQUET PHILIPPE;DELIGIANNI HARIKLIA;ROMANKIW LUBOMYR T.;VAIDYANATHAN RAMAN;HUANG QIANG;AHMED SHAFAAT
分类号 H01L31/032;C25D5/10;C25D5/50;C25D7/00;C25D7/06;C25D21/10;C25D21/12;G01B5/06;G01B11/06;H01L31/0216;H01L31/0272 主分类号 H01L31/032
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