发明名称 |
SOLID STATE IMAGE PICKUP ELEMENT AND MANUFACTURING METHOD OF THE SAME, AND ELECTRONIC INFORMATION INSTRUMENT |
摘要 |
PROBLEM TO BE SOLVED: To provide a solid state image pickup element which prevents even when a position of a surface high-concentration region for reduction in dark current which composes a light-receiving part fluctuates due to variability in processing, difficulty in reading of signal charges from the light-receiving part to a charge reading region due to the position fluctuation thereby to inhibit increase in a residual image component.SOLUTION: A CCD image sensor which has a plurality of light-receiving parts formed on an n-type epitaxial substrate 2 and reads signal charges obtained by the light-receiving parts by photoelectric conversion of incident light comprises: a light-shielding film 13 formed so as to cover regions other than n-type charge storage regions 4 which compose the light-receiving parts; and surface high-concentration regions 4a which composes the light-receiving parts are positioned with respect to openings 13a in the light-shielding film in a self-alignment manner. |
申请公布号 |
JP2014060258(A) |
申请公布日期 |
2014.04.03 |
申请号 |
JP20120204278 |
申请日期 |
2012.09.18 |
申请人 |
SHARP CORP |
发明人 |
IWATA YASUSHI |
分类号 |
H01L27/148;H01L27/14;H04N5/361;H04N5/369 |
主分类号 |
H01L27/148 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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