发明名称 CMP PAD CONDITIONER, AND METHOD FOR PRODUCING THE CMP PAD CONDITIONER
摘要 This invention relates to a conditioner for a CMP (Chemical Mechanical Polishing) pad, which is used in a CMP process which is part of the fabrication of a semiconductor device, and more particularly, to a CMP pad conditioner in which the structure of the cutting tips is such that the change in the wear of the polishing pad is not great even when different kinds of slurry are used and when there are changes in pressure of the conditioner, and to a method of manufacturing the same.
申请公布号 US2014094101(A1) 申请公布日期 2014.04.03
申请号 US201214117936 申请日期 2012.05.15
申请人 SAMSUNG ELECTRONICS CO., LTD.;EHWA DIAMOND INDUSTRIAL CO., LTD. 发明人 LEE SEH KWANG;KIM YOUN CHUL;LEE JOO HAN;CHOI JAE KWANG;BOO JAE PHIL
分类号 B24B53/017;B24D18/00 主分类号 B24B53/017
代理机构 代理人
主权项
地址