发明名称 NONCONTACT RAPID DEFECT DETECTION OF BARRIER FILMS
摘要 <p>A method of detecting a defect in a barrier film. The method includes: coating the barrier film with a solution having a plurality of probes, where each of the probes has a nanoparticle; forcing a probe of the plurality of probes to penetrate the defect by applying a field to the barrier film, where the field induces an attractive power to the nanoparticles of the probes; applying an optical excitation (OE) to the barrier film; and identifying the defect in the barrier film based on an optical signal emitted, in response to the OE, by the probe forced to penetrate the defect.</p>
申请公布号 WO2014052668(A1) 申请公布日期 2014.04.03
申请号 WO2013US62038 申请日期 2013.09.26
申请人 KONICA MINOLTA LABORATORY U.S.A., INC. 发明人 AMANO, JUN
分类号 G01N21/59;G01N21/64 主分类号 G01N21/59
代理机构 代理人
主权项
地址