发明名称 CHARGED PARTICLE RADIATION DEVICE
摘要 <p>Conventional charged particle radiation devices assumed that signals were detected while a sample is close to a diaphragm, and thus were not appropriate for observing samples that are extremely uneven in a gas atmosphere having an atmospheric pressure or a pressure that is approximately the same as atmospheric pressure. The present invention is a charged particle radiation device provided with a detachable diaphragm which allows primary charged particle beams to permeate or pass therethrough and which is disposed so as to separate a charged particle optical lens barrel from a space in which a sample is placed, wherein a detector for detecting secondary particles emitted from the sample as a consequence of being irradiated with the primary charged particle beams is disposed within the space in which the sample is placed.</p>
申请公布号 WO2014050242(A1) 申请公布日期 2014.04.03
申请号 WO2013JP67967 申请日期 2013.07.01
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 OMINAMI YUSUKE;SAKUMA NORIYUKI;KAWANISHI SHINSUKE;AJIMA MASAHIKO;ITO SUKEHIRO
分类号 H01J37/244;H01J37/16;H01J37/18;H01J37/28 主分类号 H01J37/244
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