发明名称 |
CHARGED PARTICLE RADIATION DEVICE |
摘要 |
<p>Conventional charged particle radiation devices assumed that signals were detected while a sample is close to a diaphragm, and thus were not appropriate for observing samples that are extremely uneven in a gas atmosphere having an atmospheric pressure or a pressure that is approximately the same as atmospheric pressure. The present invention is a charged particle radiation device provided with a detachable diaphragm which allows primary charged particle beams to permeate or pass therethrough and which is disposed so as to separate a charged particle optical lens barrel from a space in which a sample is placed, wherein a detector for detecting secondary particles emitted from the sample as a consequence of being irradiated with the primary charged particle beams is disposed within the space in which the sample is placed.</p> |
申请公布号 |
WO2014050242(A1) |
申请公布日期 |
2014.04.03 |
申请号 |
WO2013JP67967 |
申请日期 |
2013.07.01 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
OMINAMI YUSUKE;SAKUMA NORIYUKI;KAWANISHI SHINSUKE;AJIMA MASAHIKO;ITO SUKEHIRO |
分类号 |
H01J37/244;H01J37/16;H01J37/18;H01J37/28 |
主分类号 |
H01J37/244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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