发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE
摘要 When selectively erasing one sub-block, a control circuit applies, in a first sub-block, a first voltage to bit lines and a source line, and applies a second voltage smaller than the first voltage to the word lines. Then, the control circuit applies a third voltage lower than the first voltage by a certain value to a drain-side select gate line and a source-side select gate line, thereby performing the erase operation in the first sub-block. The control circuit applies, in a second sub-block existing in an identical memory block to the selected sub-block, a fourth voltage substantially identical to the first voltage to the drain side select gate line and the source side select gate line, thereby not performing the erase operation in the second sub-block.
申请公布号 US2014092684(A1) 申请公布日期 2014.04.03
申请号 US201314098237 申请日期 2013.12.05
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MAEDA TAKASHI
分类号 G11C16/16 主分类号 G11C16/16
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