发明名称 |
DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS METHOD, AND PROGRAM |
摘要 |
<p>Provided is a defect analysis device for improving the accuracy with which the location of a leak hole (3) formed in a pipe (1) is identified. The defect analysis device identifies the location of the leak hole (3) formed in the pipe (1) taking into account an error generated by a phase shift that occurs in the vibration data detected by a first vibration detector (20A) and that is caused by the installation environment of the first vibration detector (20A), and a phase shift that occurs in the vibration data detected by a second vibration detector (20B) and that is caused by the installation environment of the second vibration detector (20B).</p> |
申请公布号 |
WO2014050618(A1) |
申请公布日期 |
2014.04.03 |
申请号 |
WO2013JP74926 |
申请日期 |
2013.09.13 |
申请人 |
NEC CORPORATION;TAKAHASHI MASATAKE;TOMIYAMA MIZUHO;SASAKI YASUHIRO;SHINODA SHIGEKI |
发明人 |
TAKAHASHI MASATAKE;TOMIYAMA MIZUHO;SASAKI YASUHIRO;SHINODA SHIGEKI |
分类号 |
G01M3/24 |
主分类号 |
G01M3/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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