发明名称 DEFECT ANALYSIS DEVICE, DEFECT ANALYSIS METHOD, AND PROGRAM
摘要 <p>Provided is a defect analysis device for improving the accuracy with which the location of a leak hole (3) formed in a pipe (1) is identified. The defect analysis device identifies the location of the leak hole (3) formed in the pipe (1) taking into account an error generated by a phase shift that occurs in the vibration data detected by a first vibration detector (20A) and that is caused by the installation environment of the first vibration detector (20A), and a phase shift that occurs in the vibration data detected by a second vibration detector (20B) and that is caused by the installation environment of the second vibration detector (20B).</p>
申请公布号 WO2014050618(A1) 申请公布日期 2014.04.03
申请号 WO2013JP74926 申请日期 2013.09.13
申请人 NEC CORPORATION;TAKAHASHI MASATAKE;TOMIYAMA MIZUHO;SASAKI YASUHIRO;SHINODA SHIGEKI 发明人 TAKAHASHI MASATAKE;TOMIYAMA MIZUHO;SASAKI YASUHIRO;SHINODA SHIGEKI
分类号 G01M3/24 主分类号 G01M3/24
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