发明名称 TEST APPARATUS
摘要 A judgment unit judges the pass/fail of DUTs. A power supply circuit has changeable characteristics, and supplies a power supply signal to the DUTs. A condition setting unit performs a pilot test before a main test for the DUTs, and acquires a test condition to be used in the main test. The condition setting unit executes: (a) measuring a first device characteristic value for each of multiple pilot samples sampled from among the DUTs while emulating a power supply characteristic close to what is used in a user environment in which the DUT is actually used; (b) measuring a predetermined second device characteristic value for each of the multiple pilot sample devices while emulating a power supply characteristic close to what is used in a tester environment in which the main test is performed; and (c) determining the test condition based on the first and second device characteristic values.
申请公布号 US2014091830(A1) 申请公布日期 2014.04.03
申请号 US201314044635 申请日期 2013.10.02
申请人 THE UNIVERSITY OF TOKYO;ADVANTEST CORPORATION 发明人 ISHIDA MASAHIRO;KOMATSU SATOSHI;ASADA KUNIHIRO;NAKURA TORU
分类号 G01R31/28 主分类号 G01R31/28
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