发明名称 MIRROR ARRANGEMENT FOR AN EUV PROJECTION EXPOSURE APPARATUS, METHOD FOR OPERATING THE SAME, AND EUV PROJECTION EXPOSURE APPARATUS
摘要 <p>A mirror arrangement for an EUV projection exposure apparatus for microlithography comprises a plurality of mirrors each having a layer (32) which is reflective in the EUV spectral range and to which EUV radiation can be applied, and having a main body (34). In this case, at least one mirror (32) of the plurality of mirrors has at least one layer (36) comprising a material having a negative coefficient of thermal expansion. Moreover, a method for operating the mirror arrangement and a projection exposure apparatus are described. At least one heat source is arranged, in order to locally apply heat in a targeted manner to the at least one layer having a negative coefficient of thermal expansion of the at least one mirror.</p>
申请公布号 WO2014016168(A9) 申请公布日期 2014.04.03
申请号 WO2013EP65000 申请日期 2013.07.16
申请人 CARL ZEISS SMT GMBH 发明人 BITTNER, BORIS;WABRA, NORBERT;SCHNEIDER, SONJA;SCHNEIDER, RICARDA;WAGNER, HENDRIK;ILIEW, RUMEN;PAULS, WALTER
分类号 G03F7/20;G02B7/00;G02B17/06;G21K1/06 主分类号 G03F7/20
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