发明名称 |
INTERFACE BOARD OF A TESTING HEAD FOR A TEST EQUIPMENT OF ELECTRONIC DEVICES AND CORRESPONDING TESTING HEAD |
摘要 |
<p>An interface board (50) of a testing head (31) for a test equipment of electronic devices is described, such a testing head (31) comprising a plurality of contact probes (34), each contact probe (34) having at least one contact tip suitable to abut against contact pads of a device to be tested (35), as well as a contact element for the connection with a board (36) of the test equipment. Suitably, the interface board (50) comprises a substrate (51) and at least one redirecting die (40) housed on a first surface of that substrate (51) and a plurality of contact pins (53) projecting from a second surface of that substrate (51) opposed to the first surface, the redirecting die (40) comprising at least one semiconductor substrate (41) whereon at least a first plurality of contact pads (42A) is realized, suitable to contact a contact element of a contact probe (34) of the testing head (31), the contact pins (53) being suitable to contact the board (36).</p> |
申请公布号 |
WO2014009980(A8) |
申请公布日期 |
2014.04.03 |
申请号 |
WO2012IT00214 |
申请日期 |
2012.07.11 |
申请人 |
TECHNOPROBE S.P.A.;CAMPARDO, GIOVANNI;MAGGIONI, FLAVIO;LIBERINI, RICCARDO |
发明人 |
CAMPARDO, GIOVANNI;MAGGIONI, FLAVIO;LIBERINI, RICCARDO |
分类号 |
G01R31/319;G01R1/04;G01R31/28 |
主分类号 |
G01R31/319 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|