发明名称
摘要 PROBLEM TO BE SOLVED: To provide an inexpensive semiconductor device having high breakdown voltage without causing dead time even immediately after turning off of high reference potential changing in a pulse-like manner. SOLUTION: In this semiconductor device 22, (n) MOS transistor elements Tr<SB>1</SB>-Tr<SB>12</SB>(n≥2) are sequentially serially connected to one another by using a GND side and a power side as a first stage and an n-th stage, respectively; gate terminals of the MOS transistors Tr<SB>2</SB>-Tr<SB>12</SB>of the respective stages excluding the first stage are respectively sequentially connected between serially-connected resistive elements R<SB>1</SB>-R<SB>12</SB>of the respective stages; and gate terminals of at least the MOS transistors Tr<SB>2</SB>-Tr<SB>6</SB>of the lower stages, excluding the first stage, relative to the center are sequentially connected between serially-connected capacitive elements C<SB>1</SB>-C<SB>12</SB>of the respective stages through diode elements A<SB>2</SB>-A<SB>6</SB>each using a capacitive element side and a gate terminal side as an anode and a cathode, respectively. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP5458760(B2) 申请公布日期 2014.04.02
申请号 JP20090212267 申请日期 2009.09.14
申请人 发明人
分类号 H01L21/822;H01L21/76;H01L21/762;H01L21/8234;H01L27/04;H01L27/06;H01L27/08;H01L29/786 主分类号 H01L21/822
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