| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor test method for performing a test of a semiconductor device at a proper voltage. SOLUTION: A signal detection part 3c detects the operation state of an LSI 3 to be tested, and outputs a detection signal when any of operation states of a first operation state group is detected upon the transition from the first operation state group operating at a first operation speed to a second operation state operating at a second operation speed faster than the first operation speed. A supply voltage control part 1a raises a voltage supplied to the LSI 3 when detecting the detection signal. COPYRIGHT: (C)2010,JPO&INPIT |
