发明名称 |
PATTERNED WAFER INSPECTION SYSTEM USING A NON-VIBRATING CONTACT POTENTIAL DIFFERENCE SENSOR |
摘要 |
<p>A method and system for inspecting a surface of a material having a repeating pattern of relative work function. The method and system processes sensor data to identify data characteristic of the repeating pattern, and the sensor data is then further processed to remove the data characteristic of the repeating data, leading to a characteristic of non-uniformities of the material surface.</p> |
申请公布号 |
EP2394294(B1) |
申请公布日期 |
2014.04.02 |
申请号 |
EP20100738973 |
申请日期 |
2010.01.26 |
申请人 |
QCEPT TECHNOLOGIES INC. |
发明人 |
SCHULZE, MARK A.;LIU, JUN;HAWTHORNE, JEFFREY ALAN |
分类号 |
H01L21/66;G01R31/312 |
主分类号 |
H01L21/66 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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