发明名称 NONVOLATILE MEMORY WITH VARIABLE READ THRESHOLD
摘要 <p>Data is read from a nonvolatile memory array using one or more read voltages that are adjusted during memory life. Programming target voltages and read voltages may be adjusted together over memory life to map memory states to an increasingly wide threshold window. Individual memory states are mapped to sub-ranges that are made wider, reducing errors.</p>
申请公布号 EP2084709(B1) 申请公布日期 2014.04.02
申请号 EP20070863614 申请日期 2007.10.29
申请人 SANDISK TECHNOLOGIES INC. 发明人 BRANDMAN, YIGAL;CONLEY, KEVIN M.
分类号 G11C11/56 主分类号 G11C11/56
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