发明名称 |
SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF DETECTING TEMPERATURE |
摘要 |
Standby time for starting a thermal process is reduced. A substrate processing apparatus includes a reaction pipe which receives a substrate support unit which supports substrates and treats the substrate supported on the substrate; a heating part which in installed in the outer part of the reaction pipe and heats the reaction pipe; a protection pipe which is installed to touch the outer wall of the reaction pipe; an insulating pipe which is arranged in the protection pipe and has an inner part which has a through hole; a thermocouple which includes an upper part where a thermocouple contact part is formed and a thermocouple element wire is inserted into the trough hole; a gas supply part which supplies a gas for treating the substrate received in the reaction pipe to the reaction pipe; and a discharging part which discharges the gas from the reaction pipe. |
申请公布号 |
KR20140039987(A) |
申请公布日期 |
2014.04.02 |
申请号 |
KR20130103884 |
申请日期 |
2013.08.30 |
申请人 |
HITACHI KOKUSAI ELECTRIC INC. |
发明人 |
YAMAGUCHI HIDETO;KOSUGI TETSUYA;UENO MASAAKI |
分类号 |
H01L21/324 |
主分类号 |
H01L21/324 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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