发明名称 SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF DETECTING TEMPERATURE
摘要 Standby time for starting a thermal process is reduced. A substrate processing apparatus includes a reaction pipe which receives a substrate support unit which supports substrates and treats the substrate supported on the substrate; a heating part which in installed in the outer part of the reaction pipe and heats the reaction pipe; a protection pipe which is installed to touch the outer wall of the reaction pipe; an insulating pipe which is arranged in the protection pipe and has an inner part which has a through hole; a thermocouple which includes an upper part where a thermocouple contact part is formed and a thermocouple element wire is inserted into the trough hole; a gas supply part which supplies a gas for treating the substrate received in the reaction pipe to the reaction pipe; and a discharging part which discharges the gas from the reaction pipe.
申请公布号 KR20140039987(A) 申请公布日期 2014.04.02
申请号 KR20130103884 申请日期 2013.08.30
申请人 HITACHI KOKUSAI ELECTRIC INC. 发明人 YAMAGUCHI HIDETO;KOSUGI TETSUYA;UENO MASAAKI
分类号 H01L21/324 主分类号 H01L21/324
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