发明名称 Bonding layer structure and method for wafer to wafer bonding
摘要 A structure comprises a first semiconductor substrate, a first bonding layer deposited on a bonding side the first semiconductor substrate, a second semiconductor substrate stacked on top of the first semiconductor substrate and a second bonding layer deposited on a bonding side of the second semiconductor substrate, wherein the first bonding layer is of a horizontal length greater than a horizontal length of the second semiconductor substrate, and wherein there is a gap between an edge of the second bonding layer and a corresponding edge of the second semiconductor substrate.
申请公布号 US8686571(B2) 申请公布日期 2014.04.01
申请号 US201213571260 申请日期 2012.08.09
申请人 HUANG HSIN-TING;PENG JUNG-HUEI;TSAI SHANG-YING;HUNG LI-MIN;HUANG YAO-TE;TENG YI-CHUAN;CHO CHIN-YI;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG HSIN-TING;PENG JUNG-HUEI;TSAI SHANG-YING;HUNG LI-MIN;HUANG YAO-TE;TENG YI-CHUAN;CHO CHIN-YI
分类号 H01L33/00;H01L23/48 主分类号 H01L33/00
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