发明名称 Trench isolation implantation
摘要 Embodiments of the disclosure include a shallow trench isolation structure having a dielectric material with energetic species implanted to a predetermined depth of the dielectric material. Embodiments further include methods of fabricating the trench structures with the implant of energetic species to the predetermined depth. In various embodiments the implant of energetic species is used to densify the dielectric material to provide a uniform wet etch rate across the surface of the dielectric material. Embodiments also include memory devices, integrated circuits, and electronic systems that include shallow trench isolation structures having the dielectric material with the high flux of energetic species implanted to the predetermined depth of the dielectric material.
申请公布号 US8686535(B2) 申请公布日期 2014.04.01
申请号 US20100758488 申请日期 2010.04.12
申请人 SANDHU GURTEJ S.;SMYTHE, III JOHN A.;MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.;SMYTHE, III JOHN A.
分类号 H01L21/70 主分类号 H01L21/70
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