发明名称 Solid-state imaging device, fabrication method thereof, imaging apparatus, and fabrication method of anti-reflection structure
摘要 A fabrication method of an anti-reflection structure includes the steps of: forming a resin film having micro-particles dispersed therein on a surface of a substrate; forming a protrusion dummy pattern on the resin film by etching the resin film using the micro-particles in the resin film as a mask while gradually etching the micro-particles; and forming a protrusion pattern on the surface of the substrate by etching back the surface of the substrate together with the resin film having the protrusion dummy pattern formed thereon, and transferring a surface shape of the protrusion dummy pattern formed on a surface of the resin film to the surface of the substrate.
申请公布号 US8685856(B2) 申请公布日期 2014.04.01
申请号 US20100728448 申请日期 2010.03.22
申请人 MAEDA KENSAKU;KOIKE KAORU;SASAKI TOHRU;TATSUMI TETSUYA;SONY CORPORATION 发明人 MAEDA KENSAKU;KOIKE KAORU;SASAKI TOHRU;TATSUMI TETSUYA
分类号 H01L31/0236 主分类号 H01L31/0236
代理机构 代理人
主权项
地址