发明名称 Phase-change random access memory device and method of manufacturing the same
摘要 The PCRAM device includes a semiconductor substrate including a switching device; an interlayer insulating layer having a heating electrode contact hole exposing the switching device, a heating electrode formed to be extended along a side of the interlayer insulating layer in the heating electrode contact hole, wherein the heating electrode has a width gradually increased toward a bottom of the heating electrode and is in contact with the switching device, first and second phase-change layers formed within the heating electrode contact hole that includes the heating electrode, and a phase-change separation layer formed in the heating electrode contact hole between the first and second phase-change layers.
申请公布号 US8686385(B2) 申请公布日期 2014.04.01
申请号 US201113337421 申请日期 2011.12.27
申请人 YANG JIN SEOK;JUNG HA CHANG;HYNIX SEMICONDUCTOR INC. 发明人 YANG JIN SEOK;JUNG HA CHANG
分类号 H01L29/02;H01L47/00 主分类号 H01L29/02
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