发明名称 Chemical mechanical planarization pad with void network
摘要 A polishing pad and a method of producing a polishing pad. The method includes providing a mold, having a first cavity and a second cavity, wherein the first cavity defines a recess, providing a polymer matrix material including void forming elements in the recess, forming a polishing pad and removing at least a portion of the elements from the polishing pad forming void spaces within the polishing pad by one of a chemical method or mechanical method, prior to use in chemical/mechanical planarization procedures.
申请公布号 US8684794(B2) 申请公布日期 2014.04.01
申请号 US20080185737 申请日期 2008.08.04
申请人 LEFEVRE PAUL;HSU OSCAR K.;WELLS DAVID ADAM;QIAO SCOTT XIN;MATHEW ANOOP;WU GUANGWEI;FNS TECH CO., LTD. 发明人 LEFEVRE PAUL;HSU OSCAR K.;WELLS DAVID ADAM;QIAO SCOTT XIN;MATHEW ANOOP;WU GUANGWEI
分类号 B24B7/22;B24D3/34 主分类号 B24B7/22
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