发明名称 METHODS OF FORMING TRANSISTORS AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES INCLUDING THE SAME
摘要 <p>In a transistor forming method, a trench is formed by partially removing the top of a substrate. An element separating film including a void on the top is formed in the trench to define an active pattern on the substrate. A photoresist pattern is formed on the active pattern and the element separating film. A recess is formed by partially removing the element separating film and the active pattern by using the photoresist pattern as an etch mask. The void is embedded and the pattern is removed by performing a plasma processing process. A gate insulating film and a gate electrode embedding the recess are formed. [Reference numerals] (AA) Two-dimensional barcode; (BB) Recognize an image code; (CC) Confirmed; (DD) End</p>
申请公布号 KR20140038788(A) 申请公布日期 2014.03.31
申请号 KR20120105328 申请日期 2012.09.21
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, DOO WHAN;YUN, JUNG BONG;CHOI, CHANG WON
分类号 H01L21/336;H01L29/78 主分类号 H01L21/336
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