| 摘要 |
The invention refers to sensors for scanning probing microscopy (SPM), which offer high precision and resolution of measurement, a method for three-dimensional measurement with such sensors and a method for their production, which, by measuring the variations of the amplitude, the frequency, of the phase difference or of the tunnel current, find an application for the determination of the topography, the geometrical size or some other characteristic of objects in various fields of engineering. The sensors consist of a body, a micro bracket and a probing part, which have a common plane surface within which at least one element is structured for functioning in the form of an orifice and/or a gutter, in which a heterogeneous probing element is positioned in the form of a carbon nanotube (CNT), a boron or boron nitride nanotube, a nanothread, a nanocrystal, etc., including such with a complex form, e.g. a cylinder with a sphere. The method of three dimensional measurement offers the possibility, by using sensors with elasticity in the three directions, with the usual technology of scanning probe microscopy , by measuring in a given point, to determine the characteristics of the sample in the three directions without rotating the sensor and/or the sample under study. The invention involves also a method for obtaining the sensors described in a reproducible and precise manner. |
