发明名称 Projection objective of a microlithographic projection exposure apparatus
摘要 A projection objective of a microlithographic projection exposure apparatus has a high index refractive optical element with an index of refraction greater than 1.6. This element has a volume and a material related optical property which varies over the volume. Variations of this optical property cause an aberration of the objective. In one embodiment at least 4 optical surfaces are provided that are arranged in at least one volume which is optically conjugate with the volume of the refractive optical element. Each optical surface comprises at least one correction means, for example a surface deformation or a birefringent layer with locally varying properties, which at least partially corrects the aberration caused by the variation of the optical property.
申请公布号 KR101379096(B1) 申请公布日期 2014.03.28
申请号 KR20087027940 申请日期 2007.06.15
申请人 发明人
分类号 G02B3/00;G02B13/00;G02B27/00;G03F7/20 主分类号 G02B3/00
代理机构 代理人
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