发明名称 COMPONENT INSPECTION APPARATUS AND COMPONENT INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To solve such a problem that in a conventional technique, it is difficult to accurately detect the shape of a component arranged in a bottom surface in a cylindrical object, because light reflected by the inside of the cylindrical object and a both end-opened type conical mirror is irregularly reflected in the cylindrical object, to enter an imaging apparatus.SOLUTION: A component inspection apparatus (100) includes a cylindrical scope (105), a light-emitting component (103) fixed to the outer periphery of the scope, and an imaging apparatus (104) connected to the scope and photographing an inspection target formed in a cylindrical inspected body.
申请公布号 JP2014055845(A) 申请公布日期 2014.03.27
申请号 JP20120200636 申请日期 2012.09.12
申请人 AISIN SEIKI CO LTD 发明人 MIWA TETSUHIRO;ITO NAOKI
分类号 G01N21/954 主分类号 G01N21/954
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