| 摘要 |
The invention relates to a test arrangement comprising a waveguide, a first signal reflecting device and a second signal reflecting device. The first signal reflecting device is configured to reflect an electromagnetic signal traveling along the waveguide from the second signal reflecting device back towards the second reflecting device and to allow, at least during a time period, an electromagnetic signal traveling along the waveguide from the second signal reflecting device towards the first signal reflecting device to pass the first signal reflecting device. Hereby, a selected number of passages through a waveguide can be used to simulate passage through a much longer waveguide, and that this allows for use of a high-quality waveguide which would otherwise be too bulky, too heavy or too expensive to use depending on field of application. |
