发明名称 |
METHOD FOR PERFORMING TOMOGRAPHY ON SPECIMEN WITHIN CHARGED PARTICLE MICROSCOPE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for more efficiently performing transmission charged particle microscopy observation on a thin specimen.SOLUTION: A method for performing a tomography on a specimen within a charged particle microscope includes the steps of: generating an image of the specimen by irradiating the specimen on a tiltable specimen holder with charged particle beams and detecting transmission beams; acquiring a set of images each time a first set of specimens are tilted; constructing a composite image by combining a plurality of images from the set in a mathematical manner; selecting tilting for a second set of specimens; acquiring a group of spectrum maps by collecting spectrum maps of the specimens using a spectrum detector each time the second set of specimens are tilted; obtaining composition data relating to the specimens by analyzing the spectrum maps; and utilizing the composition data when constructing the composite image. The spectrum map may be acquired by using a method selected from a group of e.g., EDX, EELS and EFTEM. |
申请公布号 |
JP2014056820(A) |
申请公布日期 |
2014.03.27 |
申请号 |
JP20130188123 |
申请日期 |
2013.09.11 |
申请人 |
FEI CO |
发明人 |
DAVID FORD;REMCO SCHOENMAKERS |
分类号 |
H01J37/26;G01N23/04;G01N23/225;H01J37/22 |
主分类号 |
H01J37/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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