发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device in which forward voltage drop of a FWD (Free Wheel Diode) has a positive temperature coefficient and a reverse recovery operation exhibits soft recovery characteristics and resistance against breakdown by Joule heat is improved; and provide a manufacturing method of the semiconductor device.SOLUTION: An FWD comprises: an active part including a first short-lifetime region on a p-type anode layer side with respect to a depth direction, and a first long lifetime region on an n-type cathode layer side; an edge termination structure including a second short lifetime region having lifetime shorter than lifetime of the first long lifetime region in the active part; and a second long lifetime region which is formed by extension and projection of the first long lifetime region in the active part toward the edge termination structure side and which is arranged in the edge termination structure on the n-type cathode layer side.
申请公布号 JP2014056976(A) 申请公布日期 2014.03.27
申请号 JP20120201719 申请日期 2012.09.13
申请人 FUJI ELECTRIC CO LTD 发明人 KOBAYASHI YUSUKE
分类号 H01L29/861;H01L21/322;H01L29/06;H01L29/868 主分类号 H01L29/861
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