发明名称 ESD PROTECTION CIRCUIT
摘要 A device having a substrate defined with a device region is presented. The device region includes an ESD protection circuit having a transistor. The transistor includes a gate having first and second sides, a first diffusion region adjacent to the first side of the gate and a second diffusion region displaced away from the second side of the gate. The device includes a first device well which encompasses the device region and a second device well disposed within the first device well. The device further includes a drift well which encompasses the second diffusion region of which edges of the drift well do not extend below the gate and is away from a channel region, and a drain well which is disposed under the second diffusion region and extends below the gate.
申请公布号 US2014084366(A1) 申请公布日期 2014.03.27
申请号 US201313967370 申请日期 2013.08.15
申请人 GLOBALFOUNDRIES SINGAPORE PTE. LTD. 发明人 LAI DA-WEI;LI MING
分类号 H01L29/78 主分类号 H01L29/78
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