发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device which can average temperatures of a plurality of semiconductor modules when the plurality of semiconductor modules are arranged in parallel with each other along a cooling flow.SOLUTION: A semiconductor device comprises: at least two semiconductor modules each of which includes a plurality of semiconductor circuits CS1-CS8 in each of which at least one and more semiconductor chips 5A having gate terminals and gate resistances Rg1-Rg8 connected to the gate terminals are mounted, and which are arranged on a coolant 10 in a direction where an arrangement direction of the semiconductor circuits crosses a refrigerant flow; and at least one temperature detection resistance Rt1, Rt2 arranged in each semiconductor module. A gate signal is supplied to a gate signal input terminal of one semiconductor module between the two semiconductor modules via the temperature detection resistance of the other semiconductor module. A gate signal is supplied to a gate signal input terminal of the other semiconductor module via the temperature detection resistance of the one semiconductor module.
申请公布号 JP2014057006(A) 申请公布日期 2014.03.27
申请号 JP20120202078 申请日期 2012.09.13
申请人 FUJI ELECTRIC CO LTD 发明人 OKAMOTO ARIHITO
分类号 H01L25/18;H01L23/467;H01L23/58;H01L25/07;H02M7/48 主分类号 H01L25/18
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