发明名称 APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION METHOD, AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To refer to a measurement area set to one measurement tool of a plurality of measurement tools used by an appearance inspection device, as a measurement area of the other measurement tool, so as to alleviate a burden on a user.SOLUTION: To a basic image acquired by photographing a non-defective product, a reference point and a search area are set that are to be references of measurement for a first measurement tool such as a connector dimension inspection tool. A second measurement tool is then selected by a user such as an area measurement tool for executing measurement different from that of the first measurement tool. Coordinate data of a measurement area that is an area measured by the second measurement tool is referred to coordinate data, modified if required, of the reference point and search area set for the first measurement tool as necessary.
申请公布号 JP2014055916(A) 申请公布日期 2014.03.27
申请号 JP20120202271 申请日期 2012.09.14
申请人 KEYENCE CORP 发明人 IKUSHIMA YASUHISA
分类号 G01N21/88;G01B11/02;G06T1/00 主分类号 G01N21/88
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