| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method for a terminal crimped state and a device therefor that can stably inspect a defective with higher sensitivity and are suitable for inspection of a new defective generated in terminal crimping.SOLUTION: An inspection method for a terminal crimped state includes: an inspection condition setting step of calculating, as an inspection condition, a tolerance based upon a crimp force (CF) waveform of a nondefective sample and a CF waveform of a defective sample; a reference waveform acquisition step of averaging CF waveforms of nondefective samples as a reference waveform and calculating a CF value of the reference waveform; an inspection waveform acquisition step of acquiring a CF waveform in terminal crimping as an inspection waveform of an inspection object and calculating a CF value of the inspection waveform; and an acceptance determination step of determining whether the terminal crimping is accepted based upon the CF value of the reference waveform acquired in the reference waveform acquisition step and the CF value of the inspection waveform obtained in the inspection waveform acquisition step. |
