发明名称 CHEMICAL MECHANICAL POLISHER
摘要 The present invention relates to a chemical mechanical polisher. A chemical mechanical polishing process polishes a surface of a wafer to be polished by friction between a polishing pad and the surface of the wafer by applying a predetermined load to the wafer and rotating the wafer and the polishing pad in a state that the surface of the wafer to be polished is positioned on the polishing pad while supplying a slurry onto the polishing pad. A predetermined slurry is supplied to the polishing pad according to a type of a film on the wafer to be polished.Since the slurry is supplied to a rotated polishing pad, most of the slurry is discharged due to centrifugal force, and only a part of the slurry contributes to the chemical mechanical polishing process.The present invention provides a slurry storage ring adhering to the polishing pad to reduce a usage amount of the slurry by performing a polishing process in the slurry storage ring. [Reference numerals] (AA) FIG. 2a; (BB) FIG. 2b
申请公布号 KR20140036676(A) 申请公布日期 2014.03.26
申请号 KR20120103064 申请日期 2012.09.18
申请人 KIM, GUN WOO 发明人 KIM, GUN WOO;KIM, JIN GYU
分类号 H01L21/304 主分类号 H01L21/304
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