发明名称 METHOD FOR DETERMINING DEVIATIONS BETWEEN COORDINATE SYSTEMS OF VARIOUS TECHNICAL SYSTEMS
摘要 <p>Method for determining deviations between coordinate systems of different technical systems, comprising the steps of determining a coordinate position of a reference feature of a test object in the coordinate system (u,v) of a first of the technical systems, the attachment of at least one test feature to the test object, with the test feature being attached in the coordinate system of a second of the technical systems at a coordinate position that is determined in dependence on the determined coordinate position of the reference feature, the determination of a coordinate position of at least one test feature and/or at least one feature derived from it in the coordinate system (u,v) of the first technical system, and determination of deviations between the coordinate systems of the first and second technical system, at least on the basis of: (a) the determined coordinate position of at least one test feature and/or of at least one feature derived from it in the coordinate system (u,v) of the first technical system and (b) the coordinate position of the reference feature in the coordinate system (u,v) of the first technical system.</p>
申请公布号 EP2536327(B1) 申请公布日期 2014.03.26
申请号 EP20100717518 申请日期 2010.02.15
申请人 WAVELIGHT GMBH 发明人 ABRAHAM, MARIO;MATSCHNIGG, JOACHIM;AGETHEN, JOHANNES;KLAFKE, MARIO
分类号 A61B3/113;A61F9/008 主分类号 A61B3/113
代理机构 代理人
主权项
地址