| 摘要 |
The invention relates to a method for measuring thicknesses of materials of multilayered structure. This method includes transmitting one or more ultrasound signals including different frequencies into a multilayered structure consisting of two or more materials with one or more ultrasound transducers, measuring materials, acoustic properties for which are different at the frequencies in use, measuring ultrasound signals reflected from the front surface and back surface of the multilayered structure with one or more ultrasound transducer and determining thicknesses of the materials within multilayered structure from the reflected ultrasound signals. |
