发明名称 System for self-aligned contacts
摘要 A system for forming self-aligned contacts includes electroplating a first metal contact onto a Group III-V semiconductor substrate, the first metal contact having a greater height than width and having a straight sidewall profile, etching back the semiconductor substrate down to a base layer to expose an emitter semiconductor layer under the first metal contact, conformally depositing a dielectric layer on a vertical side of the first metal contact, a vertical side of the emitter semiconductor layer and on the base layer, anisotropically etching the dielectric layer off of the semiconductor substrate to form a dielectric sidewall spacer on the vertical side of the first metal contact and providing a second metal contact immediately adjacent the dielectric sidewall spacer.
申请公布号 US8679969(B2) 申请公布日期 2014.03.25
申请号 US201113196733 申请日期 2011.08.02
申请人 URTEAGA MIGUEL;PIERSON, JR. RICHARD L.;SHINOHARA KEISUKE;TELEDYNE SCIENTIFIC & IMAGING, LLC 发明人 URTEAGA MIGUEL;PIERSON, JR. RICHARD L.;SHINOHARA KEISUKE
分类号 H01L21/44;H01L21/02 主分类号 H01L21/44
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