发明名称 Determining source patterns for use in photolithography
摘要 Embodiments of a computer system, a process, a computer-program product (i.e., software), and a data structure or a file for use with the computer system are described. These embodiments may be used to determine or generate source patterns that define illumination patterns on photo-masks during a photolithographic process. Moreover, a given source pattern may be determined concurrently with an associated mask pattern (to which a given photo-mask corresponds) or sequentially (i.e., either the given source pattern may be determined before the associated mask pattern or vice versa.). During the determining, the given source pattern may be represented using one or more level-set functions. Additionally, the source pattern may be determined using an Inverse Lithography (ILT) calculation.
申请公布号 US8683396(B2) 申请公布日期 2014.03.25
申请号 US20090507336 申请日期 2009.07.22
申请人 HU CHANGQUING;PANG LINYONG;SYNOPSYS, INC. 发明人 HU CHANGQUING;PANG LINYONG
分类号 G06F17/50 主分类号 G06F17/50
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