发明名称 Manufacturing method for semiconductor device having side by side different fins
摘要 A semiconductor device includes a first fin formed of a first semiconductor material and a second fin comprising a layer formed of a second semiconductor material. The first semiconductor material is silicon, and the second semiconductor material is silicon-germanium (SiGe). The second fin further includes a layer of the first semiconductor material below the layer of the second semiconductor material. The semiconductor device also includes a hard mask layer on the first and second fins and an insulator layer that is disposed below the first and second fins. The first and second fins are used to form an N-channel and a P-channel semiconductor device, respectively.
申请公布号 US8679950(B2) 申请公布日期 2014.03.25
申请号 US201213481800 申请日期 2012.05.26
申请人 FUMITAKE MIENO;SEMICONDUCTOR MANUFACTURING INTERNATIONAL (BEIJING) CORPORATION 发明人 FUMITAKE MIENO
分类号 H01L21/20;H01L21/338;H01L21/36 主分类号 H01L21/20
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