发明名称 Detection apparatus for detecting charged particles, methods for detecting charged particles and mass spectrometer
摘要 Embodiments of the invention provide a detection apparatus for detecting charged particles having a secondary particle generator for generating secondary charged particles in response to receiving incoming charged particles, a charged particle detector for receiving and detecting secondary charged particles generated by the secondary particle generator, a photon generator for generating photons in response to receiving secondary charged particles generated by the secondary particle generator, and a photon detector for detecting the photons generated by the photon generator.
申请公布号 US8680481(B2) 申请公布日期 2014.03.25
申请号 US20100909507 申请日期 2010.10.21
申请人 GIANNAKOPULOS ANASTASSIOS;MAKAROV ALEXANDER A.;THERMO FISHER SCIENTIFIC (BREMEN) GMBH 发明人 GIANNAKOPULOS ANASTASSIOS;MAKAROV ALEXANDER A.
分类号 H01J49/40;H01J49/02 主分类号 H01J49/40
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