发明名称 Methods of fabricating a semiconductor device having metallic storage nodes
摘要 The present disclosure describes methods of fabricating a semiconductor device. An exemplary method includes forming a metal pattern on a substrate and etching the metal pattern using an etchant including at least an alkaline solution and an oxidant to form a metal electrode, where at least a portion of the surface of the metal electrode is uneven.
申请公布号 US8679935(B2) 申请公布日期 2014.03.25
申请号 US201113303500 申请日期 2011.11.23
申请人 LEE MONGSUP;HWANG INSEAK;GWAK BYOUNG-YONG;CHOI SUKHUN;LEE SANG-JUN;SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE MONGSUP;HWANG INSEAK;GWAK BYOUNG-YONG;CHOI SUKHUN;LEE SANG-JUN
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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