发明名称 Method for manufacturing a thin film transistor including a channel protecting layer
摘要 A thin film transistor includes: an insulating layer; a gate electrode provided on the insulating layer; a gate insulating film provided on the gate electrode; a semiconductor layer provided on the gate insulating film, the semiconductor layer being formed of oxide; source and drain electrodes provided on the semiconductor layer; and a channel protecting layer provided between the source and drain electrodes and the semiconductor layer. The source electrode is opposed to one end of the gate electrode. The drain electrode is opposed to another end of the gate electrode. The another end is opposite to the one end. The drain electrode is apart from the source electrode. The channel protecting layer covers at least a part of a side face of a part of the semiconductor layer. The part of the semiconductor layer is not covered with the source and drain electrodes above the gate electrode.
申请公布号 US8679904(B2) 申请公布日期 2014.03.25
申请号 US201113293298 申请日期 2011.11.10
申请人 SAITO NOBUYOSHI;UEDA TOMOMASA;NAKANO SHINTARO;UCHIKOGA SHUICHI;KABUSHIKI KAISHA TOSHIBA 发明人 SAITO NOBUYOSHI;UEDA TOMOMASA;NAKANO SHINTARO;UCHIKOGA SHUICHI
分类号 H01L21/00;H01L21/84 主分类号 H01L21/00
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