MAGNETIC FIELD GENERATION UNIT AND SEMICONDUCTOR TESTING APPARATUS COMPRISING THE SAME

摘要

A semiconductor apparatus according to the present invention comprises: a test control unit configured to input/ouput an electrical signal for testing a semiconductor apparatus including a magneto-resistive element; a test header connected to the test control unit and testing electrical characteristics of the semiconductor apparatus; and a magnetic field generation unit for supplying a magnetic field to the semiconductor apparatus. The semiconductor apparatus tests electrical characteristics thereof during application of a magnetic field.