| 摘要 |
FIELD: physics.SUBSTANCE: in the method, the surface of the recorded sample layer is exposed to circularly polarised light, which is input into a waveguide by a near-field scanning optical microscope. The sample used is a nanostructured film of transition metal silicides on silicon. The sample is tested for suitability by magnetic force microscopy with minimal resolution, which enables to display the nanostructure of the sample, wherein the size of the nanostructures must not exceed 50 nm. The sample must have magnetic response and must be in a single-domain magnetisation state. The surface of the sample is brought closer, with precision, to an optical probe with optical efficiency of not less than 10and exposed to circularly polarised radiation with energy of not less than 3 mJ/cmand continuous radiation power of about 1 mW. Information is read out using the scanning probe of the microscope in magnetic force microscopy mode in semi-contact mode by identifying magnetic properties of the nanostructured film.EFFECT: high density of recording information.2 cl, 4 dwg |
