发明名称 PATTERN FORMATION METHOD
摘要 PROBLEM TO BE SOLVED: To perform phase separation of a self-organization material having a large main film thickness with regularity.SOLUTION: According to an embodiment, a pattern formation method comprises the steps of: forming a first self-organization material layer including a first segment and a second segment on a substrate on which a guide layer is provided; forming a first self-organization pattern including a first region including the first segment and a second region including the second segment by performing phase separation of the first self-organization material layer; forming a second self-organization material layer including a third segment and a fourth segment on the first self-organization pattern; and forming a second self-organization pattern including a third region including the third segment and a fourth region including the fourth segment by performing phase separation of the second self-organization material layer.
申请公布号 JP2014053362(A) 申请公布日期 2014.03.20
申请号 JP20120194960 申请日期 2012.09.05
申请人 TOSHIBA CORP 发明人 KAWANISHI AYAKO;AZUMA TSUKASA
分类号 H01L21/3205;H01L21/027;H01L21/768 主分类号 H01L21/3205
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