发明名称 SEMICONDUCTOR STRUCTURE AND METHOD FOR MAKING SAME
摘要 An embodiment relates to a method of forming a semiconductor structure, comprising: forming a first semiconductor layer; forming a second semiconductor layer over the first semiconductor layer; forming a third semiconductor layer over the second semiconductor layer; forming an opening in the first, second and third semiconductor layers; forming a conductive region within the first, the and third semiconductor layer, the conductive region surrounding the opening, the conductive region being electrically coupled to the first semiconductor layer; forming a dielectric layer in the opening and over the conductive region; and forming a conductive layer over the dielectric layer in the opening.
申请公布号 US2014080280(A1) 申请公布日期 2014.03.20
申请号 US201314088460 申请日期 2013.11.25
申请人 INFINEON TECHNOLOGIES AG 发明人 WILHELM DETLEF;PFEIFER GUENTER;EISENER BERND;CLAEYS DIETER
分类号 H01L49/02 主分类号 H01L49/02
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