发明名称 CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS
摘要 A chemically amplified resist composition comprising a base polymer and an amine quencher in the form of aβ-alanine,γ-aminobutyric acid, 5-aminovaleric acid, 6-aminocaproic acid, 7-aminoheptanoic acid. 8-aminooctanoic acid or 9-aminononanoic acid derivative having an unsubstituted carboxyl group has a high contrast of alkaline dissolution in rate before and after exposure and forms a pattern of good profile at a high resolution, minimal roughness and wide DOF.
申请公布号 US2014080055(A1) 申请公布日期 2014.03.20
申请号 US201314022287 申请日期 2013.09.10
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 HATAKEYAMA JUN;SAGEHASHI MASAYOSHI
分类号 G03F7/038;G03F7/039;G03F7/20 主分类号 G03F7/038
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