发明名称 |
CHEMICALLY AMPLIFIED RESIST COMPOSITION AND PATTERNING PROCESS |
摘要 |
A chemically amplified resist composition comprising a base polymer and an amine quencher in the form of aβ-alanine,γ-aminobutyric acid, 5-aminovaleric acid, 6-aminocaproic acid, 7-aminoheptanoic acid. 8-aminooctanoic acid or 9-aminononanoic acid derivative having an unsubstituted carboxyl group has a high contrast of alkaline dissolution in rate before and after exposure and forms a pattern of good profile at a high resolution, minimal roughness and wide DOF. |
申请公布号 |
US2014080055(A1) |
申请公布日期 |
2014.03.20 |
申请号 |
US201314022287 |
申请日期 |
2013.09.10 |
申请人 |
SHIN-ETSU CHEMICAL CO., LTD. |
发明人 |
HATAKEYAMA JUN;SAGEHASHI MASAYOSHI |
分类号 |
G03F7/038;G03F7/039;G03F7/20 |
主分类号 |
G03F7/038 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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