发明名称 METHOD OF FABRICATING SEMICONDUCTOR DEVICE
摘要 A method of fabricating a semiconductor device includes forming a gate pattern on a substrate, and etching sides of the gate pattern using a first wet-etching process to form a first recess. The first wet-etching process includes using an etchant containing a first chemical substance including a hydroxyl functional group (—OH) and a second chemical substance capable of oxidizing the substrate. The concentration of the second chemical substance is 1.5 times or less the concentration of the first chemical substance.
申请公布号 US2014080296(A1) 申请公布日期 2014.03.20
申请号 US201313944087 申请日期 2013.07.17
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAEK JAE-JIK;CHA JI-HOON;YOON BO-UN;LEE KWANG-WOOK;HAN JEONG-NAM
分类号 H01L21/306 主分类号 H01L21/306
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