发明名称 SAMPLE OBSERVATION METHOD AND ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a sample observation method capable of easily making the visual field in a search mode and the visual field in a photo mode correspond to each other.SOLUTION: A sample observation method includes: a step of setting a first condition of an irradiation lens system and an image forming lens system in a photo mode; a step of setting a second condition of the irradiation lens system and the image forming lens system in a search mode; and a step in which, based on the first condition and the second condition, a control part controls the irradiation lens system and the image forming lens system so that an electron microscope image having a magnification between the magnification in the search mode and the magnification in the photo mode is acquired.
申请公布号 JP2014053081(A) 申请公布日期 2014.03.20
申请号 JP20120194803 申请日期 2012.09.05
申请人 JEOL LTD 发明人 MOTOKI SOHEI
分类号 H01J37/22;H01J37/26 主分类号 H01J37/22
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