发明名称 SYSTEM AND METHOD FOR DISPLAYING TEST STATES AND MARKING ABNORMALITIES
摘要 A method for an electronic device to manage test items of an object by displaying test states and marking abnormalities. The method captures an image of a state table of a finished test item displayed on a display screen of a testing device. The method further obtains a test result of the finished test item by comparing the captured image of the finished test item with a prestored standard table. When the test state of the finished test item is abnormal, the method records the captured image of the finished test item with a time index and outputs a failed message and the name of the finished test item with the time index.
申请公布号 US2014082422(A1) 申请公布日期 2014.03.20
申请号 US201313939316 申请日期 2013.07.11
申请人 HON HAI PRECISION INDUSTRY CO., LTD. 发明人 YANG FENG-CHI
分类号 G06F11/07 主分类号 G06F11/07
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