发明名称 |
SYSTEM AND METHOD FOR DISPLAYING TEST STATES AND MARKING ABNORMALITIES |
摘要 |
A method for an electronic device to manage test items of an object by displaying test states and marking abnormalities. The method captures an image of a state table of a finished test item displayed on a display screen of a testing device. The method further obtains a test result of the finished test item by comparing the captured image of the finished test item with a prestored standard table. When the test state of the finished test item is abnormal, the method records the captured image of the finished test item with a time index and outputs a failed message and the name of the finished test item with the time index. |
申请公布号 |
US2014082422(A1) |
申请公布日期 |
2014.03.20 |
申请号 |
US201313939316 |
申请日期 |
2013.07.11 |
申请人 |
HON HAI PRECISION INDUSTRY CO., LTD. |
发明人 |
YANG FENG-CHI |
分类号 |
G06F11/07 |
主分类号 |
G06F11/07 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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